Shanghai Seeyond Optoelectronics Co., Ltd.
Shanghai Seeyond Optoelectronics Co., Ltd.
Ven-ARF33
Ven-ARF33 is mainly suitable for the detection of LCoS/MicroLED AR optical machines and optical waveguides. It is the world's first revolutionary equipment that can synchronize the detection of AR optical machines and optical waveguides. Through self-developed ultra-high-precision optical system and intelligent automation platform, it realizes comprehensive and accurate measurement of key parameters such as brightness, color, and image quality, providing an efficient and reliable mass-production-level quality inspection solution for the AR industry.
● The world's first equipment that can simultaneously realize the detection of AR optical machines and optical waveguide machines
● Self-developed ultra-high PPD AR detection special NED lens
● Ultra-high PPD, MTF image quality detection is more accurate
●High UPH, production line inspection for 1 minute, greatly improving production line inspection efficiency
● Support Boresight error and virtual image distance detection
Features
Self-developed ultra-high PPD NED detection lens, specializing in AR optical detection
● Exclusive patented lens, using self-developed ultra-high PPD telephoto NED lens, with a special optical design, specially optimized for the depth of different optical machines on the market.
● Leading performance, MTF is close to the diffraction limit and has high contrast, ensuring accurate evaluation of core indicators of AR display.
Flexible adaptation
It supports matching of two lenses (DFOV 33° and DFOV 72°) to meet the diverse detection needs of optical machines with different field-angle angles.
Dedicated algorithm and expansion capabilities of dedicated AR optical machine system
● Comprehensive inspection, integrated high-precision dedicated algorithms, and one-stop coverage of core AR optical performance indicators.
● Core function integration: Built-in dedicated AR optical machine detection algorithm, one-stop support:
Precise detection of optical performance
Precision motion control
Automatic system calibration
●The algorithm can be customized according to customer applications
The upgraded version supports Boresight error and Rotation error detection.
The upgraded version adds a high-precision spectrometer module to significantly improve the accuracy of brightness/chromaticity detection.
Product parameters
| Project Type | Product specifications/technical parameters | ||
| Basic product information | Product model | Ven-ARF33 | |
| Equipment size | ≤1500*1200*2000mm | ||
| Detect objects | AR optical machine | ||
| Loading and unloading | Manual or automatic | ||
| Module alignment | electric | ||
| power | 220V/50Hz | ||
| Cleanliness | 1000 class | ||
| Software features | Dedicated AR optical machine system detection algorithm | ||
| Optical system | Detection module | DFoV 72°PPD 0°:150 Aperture diameter 4mm (2mm-5.5mm replaceable)X Y Z ND filter | DFOV: 33° PPD: 306 Aperture diameter 3.2mm (2mm-6mm can be replaced) |
| Testing items |
Accuracy | |
| LCoS optical machine | MicroLED | |
| FOV | ±0.1° | ±0.1° |
| MTF | ±3%* |
±3%* |
| distortion | ±0.1% (TV distortion) | ±0.3% |
| Contrast | ±5%* | ±5%* |
| brightness | ±3% | ±5% (0.1nit~1,000,000nit) |
| Color | ±0.003 | ±0.003 |
| Brightness uniformity (0-1) | ±3% | ±3% |
| Color uniformity (0-1) | ±0.003 | ±0.003 |
| Ghost statue | ±3%* | ±3%* |
| Dispersion | ±1.5' | ±1.5′ |
| Boresight error | ±0.05° | ±0.05° |
| Rotation error | ±0.05° | ±0.05° |
| Virtual image distance | 0.02D (under 4mm pupil conditions, 5m~inf.) |
0.02D (under 4mm pupil conditions, 5m~inf.) |
| Pixel offset | / | ±0.1Pixel (convert to screen pixels) |
*Repeat accuracy
Application scenarios
Optical performance detection for LCOS/Micro LED AR optical machines
Applicable to LCOS/Micro LED AR optical machines to view the axis deviation and Clocking detection
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Ven-ARF33 is mainly suitable for the detection of LCoS/MicroLED AR optical machines and optical waveguides. It is the world's first revolutionary equipment that can synchronize the detection of AR optical machines and optical waveguides.
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