Screen detection

challenge

Today, in the pursuit of the ultimate display effect, the research and development and quality control of various monitors face severe challenges:

Contradictory between efficiency and accuracy: In order to obtain full-view data, multiple measurements and image splicing are often required. The process is cumbersome and time-consuming, and it is difficult to meet the rapid iteration of R&D and the high-efficiency production line quality inspection requirements, and errors may be introduced in the splicing process.

Measuring bottlenecks for miniaturized devices: The size of light sources such as LED chips and MicroLED screens is small (can be as small as 6mm), which puts high requirements on measuring equipment. It is difficult for conventional equipment to take into account the small size target and the large field of view angle.

Precise capture problems at extreme perspectives: Evaluate the brightness, chromatic uniformity and contrast performance of the monitor at a very large viewing angle (such as 160°). The field of view of traditional equipment is limited, making it difficult to obtain extreme angle data in one go, resulting in incomplete evaluation of viewing angle characteristics or inefficient efficiency.

Equipment cost and flexibility limitations: Professional inspection equipment with high precision and large field of view usually depends on imports, is expensive and lacks flexibility, making it difficult to widely adapt to the diverse needs of R&D laboratories and production lines.